Mostafa Ammar, Georgia Insitute of Technology
Mohamed Gouda, University of Texas at Austin
Simon Lam, University of Texas at Austin
David Lee, Bell Labs
Ming T. (Mike) Liu, Ohio State University
Raymond Miller, University of Maryland, College Park
Krishan Sabnani, Bell Labs
Yutaka Matsushita, Keio Univ.
Mostafa Ammar, Georgia Tech
Hideo Miyahara, Osaka Univ.
David Lee, Bell Labs Research, China
Sukeichi Miki, Matsushita Electric Industrial Co.
Kenji Suzuki, KDD Co.
Teruo Higashino, Osaka Univ.
Kevin Almeroth, UCSB
Anish Arora, Ohio State Univ.
Joseph Bannister, ISI
Ernst Biersack, Eurecom
Jose' Brustoloni, Bell Labs
S. Budkowski, INT, France
Ken Calvert, UKY
Ana Cavalli, INT, France
Samuel Chanson, UST, Hong Kong
Jorge Cobb, UT, Dallas
Jon Crowcroft, Univ. College, London
Michael Dahlin, UT, Austin
Christophe Diot, Sprint Labs
Chris Edmondson-Yurkanan, UT, Austin
Mohamed Gouda, UT, Austin
Chao-Ju Jennifer Hou, Ohio State Univ.
Teruo Higashino, Osaka Univ., Japan
Hiroshi Ishida, Oki Electric Industry Co., Japan
Yoshiaki Kakuda, Hiroshima City Univ. , Japan
Hartmut Koenig, Brandenburg Univ., Germany
Naohisa Komatsu, Waseda Univ. , Japan
Y. J. Lin, Bell Labs
Ibrahim Matta, Boston Univ.
Nick F. Maxemchuk, AT&T
Masayuki Murata, Osaka Univ., Japan
Toshikane Oda, KDD R&D Laboratories, Japan
Toshio Okamoto, Toshiba Co., Japan
Sanjoy Paul, Bell Labs, Lucent
A. Petrenko, CRIM, Canada
K. K. Ramakrishnan, AT&T
Luigi Rizzo, Univ. of Pisa, Italy
Takafumi Saitoh, NTT, Japan
Shirou Sakata, NEC Co., Japan
Marco Schneider, SBC Technology Resources
Martha Steenstrup, BBN
David Su, NIST
Kenji Suzuki, KDD R&D Laboratories, Japan
Osamu Takada, Hitachi, Ltd., Japan
Makoto Takizawa, Tokyo Denki Univ., Japan
Terry Todd, McMaster University
Shuichi Tonami, Mitsubishi Electric Co., Japan
Satish K. Tripathi, UC, Riverside
Hasan Ural, Univ. Ottawa, Canada
Johnny Wong, Univ. Waterloo, Canada
Jianping Wu, Tsinghua Univ., China
David Yau, Purdue Univ.
Masanobu Yuhara, Fujitsu Laboratories, Japan
Ellen Zegura, Georgia Tech
Lixia Zhang, UCLA